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  • Secondary electron imaging and backscattered electron imaging supported at high vacuum
  • Dual frame imaging to facilitate comparison of live and retrieved images
  • A wide magnification range from the lowest 10x for wide area of view up to 60,000x
  • Enhanced quality of backscattered electron images
  • Easy observation of non-conductive samples in the direct low vacuum mode
  • Only 2 minutes 30 seconds from sample loading to imaging
  • Tilt/rotation motor drive holder - A popular option, the tilt/rotation motor drive specimen holder allows the operator to tilt and rotate the sample for well-focused 3D morphological observation. 


  • Energy dispersive X-ray spectrometer - JEOL's proprietary energy dispersive X-ray spectrometer (EDS) for elemental analysis comes with quick & reliable customer support, which guarantees satisfaction.


*Both options are retrofittable

BROOK ANCO CORPORATION - METROLOGY, MACHINE TOOLS AND MORE

Vision Beyond Precision

Precision Machine Tools

  • Easy touch panel operation
  • A complete range of automated functions (auto focus, auto stigmator, auto contrast/brightness)
  • Easy, dependable auto gun alignment (filament centering)

Copyright 2015 © Brook Anco Corporation. All rights reserved.

An Authorized Nikon Metrology and Sharp Industries Machine Tool Distributor

Intuitive touch panel operation with new GUI

  • Well-focused 3D morphological observation
  • Backscattered electron imaging for compositional distribution
  • Metrology supported
  • Imaging of tilted, rotated samples (Optional)
  • Compact body equal to an optical microscope
  • Base unit: 330mm (W) x 490mm (D) x 430mm (H); 50 kg
  • Utility: Single phase 100 V to 240 V, 50/60 Hz, 700 to 960 VA

Main Features

High Performance System in a Compact, Innovative Model
















Compact, Light, and Energy Saving


















New Capabilities for Imaging














Enhanced Low Vacuum Capability








Simple Operation








A Complete Line of Optional Accessories

Scanning electron microscope - a powerful yet economic benchtop version from Nikon and JEOL.


As an entirely new advanced imaging tool for bioscience research and industrial inspection fields, the NeoScope benchtop SEM extends your vision by combining the familiarity of a digital camera with the high resolution and depth of field of a powerful SEM. Born from the combined expertise of Nikon Instruments and JEOL, the NeoScope SEM’s advanced features are complemented by simplicity and affordability.
 
The new JCM-6000 "NeoScopeTM" is a touch panel-controlled, multi-functional desktop scanning microscope that answers the increasingly diversified needs among users worldwide.

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