Scanning electron microscope - a powerful yet economic benchtop version from Nikon and JEOL.

As an entirely new advanced imaging tool for bioscience research and industrial inspection fields, the NeoScope benchtop SEM extends your vision by combining the familiarity of a digital camera with the high resolution and depth of fieldof a powerful SEM. Born from the combined expertise of Nikon Instruments and JEOL, the NeoScope SEM’s advanced features are complemented by simplicity and affordability.
 
The new JCM-6000 "NeoScope^TM," is a touch panel controlled, multi functional desktop scanning microscope that answers the increasingly diversified needs among users worldwide.






Product Brochure: Click here to open

Categories: Scanning Electron

Applications: Cracks and Failure Analysis, Surface Analysis

Main Features

1. High-Performance System in a Compact, Innovative Model

Intuitive touch panel operation with new GUI

• Well focused 3D morphological observation
• Backscattered electron imaging for compositional distribution
• Metrology supported
• Imaging of tilted, rotated samples (Optional)

                       
                                Provides the utmost ease of operation through the touch panel system






2. Compact, Light, and Energy Saving 

• Compact body equal to an optical microscope
• Base unit: 330mm (W) x 490mm (D) x 430mm (H); 50 kg
• Utility: Single phase 100 V to 240 V, 50/60 Hz, 700 to 960 VA

 






3. New Capabilities for Imaging

• Secondary electron imaging and backscattered electron imaging supported at high vacuum
• Dual frame imaging to facilitate comparison of live and retrieved images
• A wide magnification range from the lowest 10x for wide area of view up to 60,000x

 


                                                                                       Simultaneous display of live and retrieved images 
                                                                                                 allows for comparative observation




 
4. A Complete Line of Optional Accessories

• Tilt/rotation motor drive holder

A popular option, the tilt/rotation motor drive specimen holder allows the operator to tilt and rotate the sample for well focused 3D morphological observation.

• Energy dispersive X-ray spectrometer

JEOL's proprietary energy dispersive X-ray spectrometer (EDS) for elemental analysis comes with quick & reliable customer support, which guarantees satisfaction

*Both options are retrofittable